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Triaxial Inertial Sensor with Magnetometer ADIS16400/ADIS16405
FEATURES
Triaxial, digital gyroscope with digital range scaling 75/sec, 150/sec, 300/sec settings Tight orthogonal alighment, <0.05 Triaxial, digital accelerometer, 18 g Triaxial, digital magnetometer, 2.5 gauss Autonomous operation and data collection No external configuration commands required 220 ms start-up time 4 ms sleep mode recovery time Factory-calibrated sensitivity, bias, and axial alignment ADIS16400 calibration temperature: +25C ADIS16405 calibration temperature range: -40C to +85C SPI-compatible serial interface Embedded temperature sensor Programmable operation and control Automatic and manual bias correction controls Bartlett-window FIR length, number of taps Digital I/O: data-ready, alarm indicator, general-purpose Alarms for condition monitoring Sleep mode for power management DAC output voltage Enable external sample clock input up to 1.2 kHz Single-command self-test Single-supply operation: 4.75 V to 5.25 V 2000 g shock survivability Operating temperature range: -40C to +105C
APPLICATIONS
Unmanned aerial vehicles Platform control Digital compassing Navigation
FUNCTIONAL BLOCK DIAGRAM
AUX_ ADC TEMPERATURE SENSOR TRI-AXIS MEMS ANGULAR RATE SENSOR CS SIGNAL CONDITIONING AND CONVERSION CALIBRATION AND DIGITAL PROCESSING OUTPUT REGISTERS AND SPI INTERFACE SCLK DIN DOUT TRI-AXIS MEMS ACCELERATION SENSOR AUX_ DAC
TRI-AXIS MAGNETIC SENSOR
ALARMS
POWER MANAGEMENT
VCC SELF-TEST DIGITAL CONTROL GND
07907-001
ADIS16405
RST DIO1 DIO2 DIO3 DIO4/ CLKIN
Figure 1.
GENERAL DESCRIPTION
The ADIS16400/ADIS16405 iSensor(R) products are complete inertial systems that include a triaxal gyroscope, a triaxial accelerometer, and a triaxial magnetometer. The ADIS16400/ ADIS16405 combine industry-leading iMEMS(R) technology with signal conditioning that optimizes dynamic performance. The factory calibration characterizes each sensor for sensitivity, bias, alignment, and linear acceleration (gyroscope bias). As a result, each sensor has its own dynamic compensation for correction formulas that provide accurate sensor measurements over a temperature range of -40C to +85C. The magnetometers employ a self-correction function to provide accurate bias performance over temperature, as well. The ADIS16400/ADIS16405 provide a simple, cost-effective method for integrating accurate, multi-axis inertial sensing into industrial systems, especially when compared with the
Rev. B
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
complexity and investment associated with discrete designs. All necessary motion testing and calibration are part of the production process at the factory, greatly reducing system integration time. Tight orthogonal alignment simplifies inertial frame alignment in navigation systems. An improved serial peripheral interface (SPI) and register structure provide faster data collection and configuration control. By using a compatible pinout and the same package as the ADIS1635x and ADIS1636x families, upgrading to the ADIS16400/ADIS16405 requires only firmware changes to accommodate additional sensors and register map updates. These compact modules are approximately 23 mm x 23 mm x 23 mm and provide a flexible connector interface that enables multiple mounting orientation options.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 (c)2009 Analog Devices, Inc. All rights reserved.
ADIS16400/ADIS16405 TABLE OF CONTENTS
Features .............................................................................................. 1 Applications ....................................................................................... 1 Functional Block Diagram .............................................................. 1 General Description ......................................................................... 1 Revision History ............................................................................... 2 Specifications..................................................................................... 3 Timing Specifications .................................................................. 6 Timing Diagrams.......................................................................... 6 Absolute Maximum Ratings............................................................ 7 ESD Caution .................................................................................. 7 Pin Configuration and Function Descriptions ............................. 8 Typical Performance Characteristics ............................................. 9 Theory of Operation ...................................................................... 10 Basic Operation .......................................................................... 10 Reading Sensor Data .................................................................. 10 Device Configuration ................................................................ 10 Burst Mode Data Collection ..................................................... 10 Memory Map .............................................................................. 11 Output Data Registers ............................................................... 12 Calibration................................................................................... 12 Operational Control................................................................... 13 Input/Output Functions ............................................................ 14 Diagnostics .................................................................................. 15 Outline Dimensions ....................................................................... 17 Ordering Guide .......................................................................... 17
REVISION HISTORY
7/09--Rev. A to Rev. B Changes to Features Section............................................................ 1 Changes to Data Retention Parameter........................................... 4 Changes to Table 2 ............................................................................ 6 Changes to Figure 6 .......................................................................... 8 Changes to Device Configuration Section .................................. 10 Changes to Table 8 .......................................................................... 11 Changes to Table 9 and Added Default Value to Table 10, Table 11, and Table 12 .................................................................... 12 Added Default Value to Table 13, and Table 15 and changes to Internal Sample Rate Section and Table 15 ................................. 13 Added Default Value to Table 17, Table 18, and Table 19 and Changes to Digital Filtering Section ............................................ 14 Added Default Value to Table 20 and Changes to Table 23 ...... 15 Added Default Value to Table 24, Table 25, and Table 26 and Changes to Table 24 ........................................................................ 16 Changes to Ordering Guide .......................................................... 18
4/09--Rev. 0 to Rev. A Added ADIS16400.............................................................. Universal Changes to Features ..........................................................................1 Changes to Table 1.............................................................................3 Changes to Figure 5 and Figure 6 ....................................................8 Changes to Reading Sensor Data Section ................................... 10 Changes to Internal Sample Rate Section ................................... 13 Changes to Input/Output Functions Section.............................. 14 Changes to Digital Filtering Section ............................................ 14 Changes to Ordering Guide .......................................................... 17 3/09--Revision 0: Initial Version
Rev. B | Page 2 of 20
ADIS16400/ADIS16405 SPECIFICATIONS
TA = -40C to +85C, VCC = 5.0 V, angular rate = 0/sec, dynamic range = 300/sec, 1 g, unless otherwise noted. Table 1.
Parameter GYROSCOPES Dynamic Range Initial Sensitivity Test Conditions Min 300 0.0495 Typ 350 0.05 0.025 0.0125 250 40 0.05 0.5 0.1 3 0.007 2.0 0.025 0.01 0.05 0.32 0.9 0.05 330 Max Unit /sec /sec/LSB /sec/LSB /sec/LSB ppm/C ppm/C Degrees Degrees % of FS /sec /sec /hr /sec/C /sec/C /sec/g /sec/V /sec rms /sec/Hz rms Hz g mg/LSB ppm/C ppm/C Degrees Degrees % of FS mg mg m/sec/hr mg/C mg/C mg/V mg rms mg/Hz rms Hz gauss mgauss/LSB ppm/C Degrees Degrees % of FS mgauss mgauss/C mgauss rms mgauss/Hz Hz
Sensitivity Temperature Coefficient Misalignment Nonlinearity Initial Bias Error In-Run Bias Stability Angular Random Walk Bias Temperature Coefficient Linear Acceleration Effect on Bias Bias Voltage Sensitivity Output Noise Rate Noise Density 3 dB Bandwidth ACCELEROMETERS Dynamic Range Initial Sensitivity Sensitivity Temperature Coefficient Misalignment Nonlinearity Initial Bias Error In-Run Bias Stability Velocity Random Walk Bias Temperature Coefficient Bias Voltage Sensitivity Output Noise Noise Density 3 dB Bandwidth MAGNETOMETER Dynamic Range Initial Sensitivity Sensitivity Temperature Coefficient Axis Nonorthogonality Axis Misalignment Nonlinearity Initial Bias Error Bias Temperature Coefficient Output Noise Noise Density 3 dB Bandwidth
Dynamic range = 300/sec Dynamic range = 150/sec Dynamic range = 75/sec ADIS16400: -40C TA +85C ADIS16405: -40C TA +85C Axis-to-axis, = 90 ideal Axis-to-frame (package) Best fit straight line 1 1 , SMPL_PRD = 0x01 1 , SMPL_PRD = 0x01 ADIS16400: -40C TA +85C ADIS16405: -40C TA +85C Any axis, 1 (MSC_CTRL, Bit 7 = 1) VCC = 4.75 V to 5.25 V 300/sec range, no filtering f = 25 Hz, 300/sec, no filtering
0.0505
18 3.285 ADIS16400: -40C TA +85C ADIS16405: -40C TA +85C Axis-to-axis, = 90 ideal Axis-to-frame (package) Best fit straight line, 17 g 1 1 1 ADIS16400: -40C TA +85C ADIS16405: -40C TA +85C VCC = 4.75 V to 5.25 V No filtering No filtering
3.33 120 50 0.2 0.5 0.1 50 0.2 0.2 1.35 0.3 2.5 9 0.5 330 3.5 0.5 600 0.25 0.5 0.5 4 0.5 1.25 0.066 1540
3.38
25C 25C, 1 25C, axis-to-axis 25C, axis-to-base plate and guide pins Best fit straight line 25C, 0 gauss stimulus 25C, no filtering 25C, no filtering, rms
2.5 0.49
0.51
Rev. B | Page 3 of 20
ADIS16400/ADIS16405
Parameter TEMPERATURE SENSOR Scale Factor ADC INPUT Resolution Integral Nonlinearity Differential Nonlinearity Offset Error Gain Error Input Range Input Capacitance DAC OUTPUT Resolution Relative Accuracy Differential Nonlinearity Offset Error Gain Error Output Range Output Impedance Output Settling Time LOGIC INPUTS 1 Input High Voltage, VINH Input Low Voltage, VINL CS Wake-Up Pulse Width Logic 1 Input Current, IINH Logic 0 Input Current, IINL All Pins Except RST RST Pin Input Capacitance, CIN DIGITAL OUTPUTS1 Output High Voltage, VOH Output Low Voltage, VOL FLASH MEMORY Data Retention 3 FUNCTIONAL TIMES 4 Power-On Start-Up Time Reset Recovery Time Sleep Mode Recovery Time Flash Memory Test Time Automatic Self-Test Time CONVERSION RATE Clock Accuracy Sync Input Clock Test Conditions 25C, output = 0x0000 Min Typ 0.14 12 2 1 4 2 0 During acquisition 20 12 4 1 5 0.5 0 5 k/100 pF to GND 2.0 CS signal to wake up from sleep mode 20 VIH = 3.3 V VIL = 0 V 0.2 -40 -1 10 ISOURCE = 1.6 mA ISINK = 1.6 mA Endurance 2 TJ = 85C Time until data is available Normal mode, SMPL_PRD 0x09 Low power mode, SMPL_PRD 0x0A Normal mode, SMPL_PRD 0x09 Low power mode, SMPL_PRD 0x0A Normal mode, SMPL_PRD 0x09 Low power mode, SMPL_PRD 0x0A Normal mode, SMPL_PRD 0x09 Low power mode, SMPL_PRD 0x0A SMPL_PRD = 0x01 SMPL_PRD = 0x01 to 0xFF 2.4 0.4 10,000 20 220 290 100 170 4 15 17 90 12 0.413 819.2 3 1.2 10 -60 0.8 0.55 2 10 3.3 3.3 Max Unit C/LSB Bits LSB LSB LSB LSB V pF Bits LSB LSB mV % V s V V V s A A mA pF V V Cycles Years ms ms ms ms ms ms ms ms SPS % kHz
Code 101 to Code 4095, 5 k/100 pF to GND
Rev. B | Page 4 of 20
ADIS16400/ADIS16405
Parameter POWER SUPPLY Operating Voltage Range, VCC Power Supply Current Test Conditions Min 4.75 Low power mode at 25C Normal mode at 25C Sleep mode at 25C Typ 5.0 45 70 600 Max 5.25 Unit V mA mA A
1 2 3
The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant. Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at -40C, +25C, +85C, and +125C. The data retention lifetime equivalent is at a junction temperature (TJ) of 85C as per JEDEC Standard 22, Method A117. Data retention lifetime decreases with junction temperature. 4 These times do not include thermal settling and internal filter response times (330 Hz bandwidth), which may affect overall accuracy.
Rev. B | Page 5 of 20
ADIS16400/ADIS16405
TIMING SPECIFICATIONS
TA = 25C, VCC = 5 V, unless otherwise noted. Table 2.
Normal Mode (SMPL_PRD 0x09) Min 1 Typ Max 0.01 2.0 9 40 48.8 100 24.4 48.8 5 12.5 5 12.5 5 5 600 833 Low Power Mode (SMPL_PRD 0x0A) Min1 Typ Max 0.01 0.3 75 150 48.8 100 24.4 48.8 5 12.5 5 12.5 5 Burst Mode Min1 Typ Max 0.01 1.0 1/fSCLK 48.8 100 24.4 48.8 5 5 5 5 600 833 12.5 12.5
Parameter fSCLK tSTALL tREADRATE tCS tDAV tDSU tDHD tSCLKR, tSCLKF tDF, tDR tSFS t1 t2 t3
1
Description Serial clock frequency Stall period between data Read rate Chip select to clock edge DOUT valid after SCLK edge DIN setup time before SCLK rising edge DIN hold time after SCLK rising edge SCLK rise/fall times DOUT rise/fall times CS high after SCLK edge Input sync pulse width Input sync to data ready output Input sync period
Unit MHz s s ns ns ns ns ns ns ns s s s
Guaranteed by design and characterization but not tested in production.
TIMING DIAGRAMS
CS
tCS
SCLK 1 2 3 4 5 6 15 16
tSFS
tDAV
DOUT MSB DB14 DB13 DB12 DB11 DB10 DB2 DB1 LSB
tDSU
DIN W/R A6 A5
tDHD
A4 A3 A2 D2 D1 LSB
07907-002
Figure 2. SPI Timing and Sequence
tREADRATE tSTALL
CS
07907-003
SCLK
Figure 3. Stall Time and Data Rate
t3 t2 t1
SYNC CLOCK (DIO4) DATA READY
07907-004
Figure 4. Input Clock Timing Diagram
Rev. B | Page 6 of 20
ADIS16400/ADIS16405 ABSOLUTE MAXIMUM RATINGS
Table 3.
Parameter Acceleration Any Axis, Unpowered Any Axis, Powered VCC to GND Digital Input Voltage to GND Digital Output Voltage to GND Analog Input to GND Operating Temperature Range Storage Temperature Range
1
Rating 2000 g 2000 g -0.3 V to +6.0 V -0.3 V to +5.3 V -0.3 V to VCC + 0.3 V -0.3 V to +3.6 V -40C to +105C -65C to +125C1, 2
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Table 4. Package Characteristics
Package Type 24-Lead Module JA 39.8C/W JC 14.2C/W Device Weight 16 grams
Extended exposure to temperatures outside the specified temperature range of -40C to +105C can adversely affect the accuracy of the factory calibration. For best accuracy, store the parts within the specified operating range of -40C to +105C. 2 Although the device is capable of withstanding short-term exposure to 150C, long-term exposure threatens internal mechanical integrity.
ESD CAUTION
Rev. B | Page 7 of 20
ADIS16400/ADIS16405 PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
ADIS16400/ADIS16405
AUX_ADC
TOP VIEW (Not to Scale)
SCLK DIO3 DIO1 DIO2 GND GND DNC DNC VCC DIN
1
3
5
7
9
11
13
15
17
19
21
23
2
DIO4/CLKIN
4
DOUT
6
CS
8
RST
10
VCC
12
VCC
14
GND
16
DNC
18
DNC
20
AUX_DAC
22
DNC
24
DNC
Figure 5. Pin Configuration
aZ
Z-AXIS
mZ gZ
Y-AXIS
aY
mX
X-AXIS
mY gY
PIN 23 PIN 1 ORIGIN ALIGNMENT REFERENCE POINT SEE MSC_CTRL[6].
aX gX
NOTES 1. aX, aY, aZ, ARROWS INDICATE THE DIRECTION OF ACCELERATION THAT PRODUCES A POSITIVE OUTPUT. 2. gX, gY, gZ, ARROWS INDICATE THE DIRECTION OF ROTATION THAT PRODUCES A POSITIVE OUTPUT. 3. mX, mY, mZ, ARROWS INDICATE THE DIRECTION OF MAGNETIC FIELD THAT PRODUCES A POSITIVE OUTPUT.
07907-005
NOTES 1. THIS VIEW REPRESENTS THE TOP VIEW OF THE MATING CONNECTOR. 2. WHEN CONNECTED TO THE ADIS16400/ADIS16405, THE PINS ARE NOT VISIBLE. 3. MATING CONNECTOR: SAMTEC CLM-112-02 OR EQUIVALENT. 4. DNC = DO NOT CONNECT.
DNC
Figure 6. Axial Orientation
Table 5. Pin Function Descriptions
Pin No. 1 2 16, 17, 18, 19, 22, 23, 24 3 4 5 6 7 8 9 10, 11, 12 13, 14, 15 20 21
1
Mnemonic DIO3 DIO4/CLKIN DNC SCLK DOUT DIN CS DIO1 RST DIO2 VCC GND AUX_DAC AUX_ADC
Type1 I/O I/O N/A I O I I I/O I I/O S S O I
Description Configurable Digital Input/Output. Configurable Digital Input/Output or Sync Clock Input. Do Not Connect. SPI Serial Clock. SPI Data Output. Clocks output on SCLK falling edge. SPI Data Input. Clocks input on SCLK rising edge. SPI Chip Select. Configurable Digital Input/Output. Reset. Configurable Digital Input/Output. Power Supply. Power Ground. Auxiliary, 12-Bit DAC Output. Auxiliary, 12-Bit ADC Input.
S is supply, O is output, I is input, N/A is not applicable. Rev. B | Page 8 of 20
07907-006
ADIS16400/ADIS16405 TYPICAL PERFORMANCE CHARACTERISTICS
0.1 0.01 ROOT ALLAN VARIANCE (/sec) ROOT ALLAN VARIANCE (g)
+1 0.01 MEAN
0.001
+1 MEAN -1
07907-008
-1
1
10
100 Tau (sec)
1k
10k
07907-007
0.001 0.1
0.0001 0.1
1
10
100 Tau (sec)
1k
10k
Figure 7. Gyroscope Root Allan Variance
Figure 8. Accelerometer Root Allan Variance
Rev. B | Page 9 of 20
ADIS16400/ADIS16405 THEORY OF OPERATION
BASIC OPERATION
The ADIS16400/ADIS16405 are autonomous sensor systems that start up after a valid power supply voltage is applied and then begin producing inertial measurement data at the factorydefault sample rate of 819.2 SPS. After each sample cycle, the sensor data loads into the output registers and DIO1 pulses, providing a new data ready control signal for driving systemlevel interrupt service routines. In a typical system, a master processor accesses the output data registers through the SPI interface, using the hook-up shown in Figure 9. Table 6 provides a generic functional description for each pin on the master processor. Table 7 describes the typical master processor settings normally found in a configuration register and used for communicating with the ADIS16400/ADIS16405.
I/O LINES ARE COMPATIBLE WITH 3.3V OR 5V LOGIC LEVELS VDD
10 11 12
Table 8 lists the lower byte address for each register, and Figure 10 shows the generic bit assignments.
07907-010
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
0
UPPER BYTE
LOWER BYTE
Figure 10. Output Register Bit Assignments
READING SENSOR DATA
Although the ADIS16400/ADIS16405 produce data independently, these operate as SPI slave devices that communicate with system (master) processors using the 16-bit segments displayed in Figure 11. Individual register reads require two such 16-bit sequences. The first 16-bit sequence provides the read command bit (R/W = 0) and the target register address (A6 to A0). The second sequence transmits the register contents (D15 to D0) on the DOUT line. For example, if DIN = 0x0A00, the content of XACCL_OUT shifts out on the DOUT line during the next 16-bit sequence. The SPI operates in full duplex mode, which means that the master processor can read the output data from DOUT while using the same SCLK pulses to transmit the next target address on DIN.
5V
SYSTEM PROCESSOR SPI MASTER
SS SCLK MOSI MISO IRQ
6 3 5 4 7
CS SCLK DIN DOUT DIO1
13
ADIS16405
SPI SLAVE
DEVICE CONFIGURATION
The user register memory map (Table 8) identifies configuration registers with either a W (write only) or R/W (read/write). Configuration commands also use the bit sequence displayed in Figure 11. If the MSB is equal to 1, the last eight bits (DC7 to DC0) in the DIN sequence load into the memory address associated with the address bits (A5 to A0). For example, if DIN = 0xA11F, then 0x1F loads into Address Location 0x21 (XACCL_OFF, upper byte) at the conclusion of the data frame. Most of the registers have a backup location in nonvolatile flash memory. The master processor must manage the backup function. Set GLOB_CMD[3] = 1 (DIN = 0xBE04) to execute a manual flash update (backup) operation, which copies the user registers into their respective flash memory locations. This operation takes 50 ms and requires the power supply voltage to be within the specified limit to complete properly. The FLASH_CNT register provides a running count of these events for managing the longterm reliability of the flash memory.
14
15
07907-009
Figure 9. Electrical Hook-Up Diagram
Table 6. Generic Master Processor Pin Names and Functions
Pin Name SS IRQ MOSI MISO SCLK Function Slave select Interrupt request Master output, slave input Master input, slave output Serial clock
Table 7. Generic Master Processor SPI Settings
Processor Setting Master SCLK Rate 2 MHz1 CPOL = 1 CPHA = 1 MSB-First 16-Bit
1
Description The ADIS16400/ADIS16405 operate as a slave. Normal mode, SMPL_PRD[7:0] 0x08. Clock polarity. Clock phase. Bit sequence. Shift register/data length.
BURST MODE DATA COLLECTION
Burst mode data collection offers a more efficient method for collecting data from the ADIS16400/ADIS16405. In sequential data cycles (each separated by one SCLK period), all output registers clock out on DOUT. This sequence starts when the DIN sequence is 0011 1110 0000 0000 (0x3E00). Next, the contents of each output register are output from DOUT, starting with SUPPLY_OUT and ending with AUX_ADC (see Figure 12). The addressing sequence shown in Table 8 determines the order of the outputs in burst mode.
For burst mode, SCLK rate 1 MHz. For low power mode, SCLK rate 300 kHz.
The user registers provide addressing for all input/output operations on the SPI interface. Each 16-bit register has two 7-bit addresses: one for its upper byte and one for its lower byte.
Rev. B | Page 10 of 20
ADIS16400/ADIS16405
MEMORY MAP
Table 8. User Register Memory Map
Name FLASH_CNT SUPPLY_OUT XGYRO_OUT YGYRO_OUT ZGYRO_OUT XACCL_OUT YACCL_OUT ZACCL_OUT XMAGN_OUT YMAGN_OUT ZMAGN_OUT TEMP_OUT AUX_ADC XGYRO_OFF YGYRO_OFF ZGYRO_OFF XACCL_OFF YACCL_OFF ZACCL_OFF XMAGN_HIF YMAGN_HIF ZMAGN_HIF XMAGN_SIF YMAGN_SIF ZMAGN_SIF GPIO_CTRL MSC_CTRL SMPL_PRD SENS_AVG SLP_CNT DIAG_STAT GLOB_CMD ALM_MAG1 ALM_MAG2 ALM_SMPL1 ALM_SMPL2 ALM_CTRL AUX_DAC PRODUCT_ID
1
R/W R R R R R R R R R R R R R R/W R/W R/W R/W R/W R/W R/W R/W R/W R/W R/W R/W R/W R/W R/W R/W W R W R/W R/W R/W R/W R/W R/W
Flash Backup Yes No No No No No No No No No No No No Yes Yes Yes Yes Yes Yes Yes Yes Yes Yes Yes Yes No Yes Yes Yes No No N/A Yes Yes Yes Yes Yes No
Address 1 0x00 0x02 0x04 0x06 0x08 0x0A 0x0C 0x0E 0x10 0x12 0x14 0x16 0x18 0x1A 0x1C 0x1E 0x20 0x22 0x24 0x26 0x28 0x2A 0x2C 0x2E 0x30 0x32 0x34 0x36 0x38 0x3A 0x3C 0x3E 0x40 0x42 0x44 0x46 0x48 0x4A 0x4C to 0x55 0x56
Default N/A N/A N/A N/A N/A N/A N/A N/A N/A N/A N/A N/A N/A 0x0000 0x0000 0x0000 0x0000 0x0000 0x0000 0x0000 0x0000 0x0000 0x0800 0x0800 0x0800 0x0000 0x0006 0x0001 0x0402 0x0000 0x0000 0x0000 0x0000 0x0000 0x0000 0x0000 0x0000 0x0000 0x4105
Function Flash memory write count Power supply measurement X-axis gyroscope output Y-axis gyroscope output Z-axis gyroscope output X-axis accelerometer output Y-axis accelerometer output Z-axis accelerometer output X-axis magnetometer measurement Y-axis magnetometer measurement Z-axis magnetometer measurement Temperature output Auxiliary ADC measurement X-axis gyroscope bias offset factor Y-axis gyroscope bias offset factor Z-axis gyroscope bias offset factor X-axis acceleration bias offset factor Y-axis acceleration bias offset factor Z-axis acceleration bias offset factor X-axis magnetometer, hard-iron factor Y-axis magnetometer, hard-iron factor Z-axis magnetometer, hard-iron factor X-axis magnetometer, soft-iron factor Y-axis magnetometer, soft-iron factor Z-axis magnetometer, soft-iron factor Auxiliary digital input/output control Miscellaneous control Internal sample period (rate) control Dynamic range and digital filter control Sleep mode control System status System command Alarm 1 amplitude threshold Alarm 2 amplitude threshold Alarm 1 sample size Alarm 2 sample size Alarm control Auxiliary DAC data Reserved Product identifier
Bit Assignments N/A See Table 9 See Table 9 See Table 9 See Table 9 See Table 9 See Table 9 See Table 9 See Table 9 See Table 9 See Table 9 See Table 9 See Table 9 See Table 10 See Table 10 See Table 10 See Table 11 See Table 11 See Table 11 See Table 12 See Table 12 See Table 12 See Table 13 See Table 13 See Table 13 See Table 18 See Table 19 See Table 15 See Table 17 See Table 16 See Table 23 See Table 14 See Table 25 See Table 25 See Table 26 See Table 26 See Table 24 See Table 20
Each register contains two bytes. The address of the lower byte is displayed. The address of the upper byte is equal to the address of the lower byte plus 1.
CS SCLK DIN DOUT R/W D15 A6 D14 A5 D13 A4 D12 A3 D11 A2 D10 A1 D9 A0 D8 DC7 D7 DC6 D6 DC5 D5 DC4 D4 DC3 D3 DC2 D2 DC1 D1 DC0 D0 R/W D15 A6 D14 A5 D13
07907-011
NOTES 1. DOUT BITS ARE BASED ON THE PREVIOUS 16-BIT SEQUENCE (R = 0).
Figure 11. Output Register Bit Assignments
Rev. B | Page 11 of 20
ADIS16400/ADIS16405
CS 1 2 3 4 5 13
SCLK
DIN
0x3E00
DON'T CARE
07907-012 07907-014
DOUT
PREVIOUS
SUPPLY_OUT
XGYRO_OUT
YGYRO_OUT
ZGYRO_OUT
AUX_ADC
Figure 12. Burst Mode Read Sequence
OUTPUT DATA REGISTERS
Figure 6 provides the positive measurement direction for each gyroscope, accelerometer, and magnetometer. Table 9 provides the configuration and scale factor for each output data register in the ADIS16400/ADIS16405. All inertial sensor outputs are in 14-bit, twos complement format, which means that 0x0000 is equal to 0 LSB, 0x0001 is equal to +1 LSB, and 0x3FFF is equal to -1 LSB. The following is an example of how to calculate the sensor measurement from the XGYRO_OUT: XGYRO_OUT = 0x3B4A 0x000 - 0x3B4A = -0x04B6 = (4 x 256 + 11 x 16 + 6) - 0x04B6 = -1206 LSB Rate = 0.05/sec x (-1206) = -60.3/sec Therefore, an XGYRO_OUT output of 0x3B4A corresponds to a clockwise rotation about the z-axis (see Figure 6) of 60.3/sec when looking at the top of the package. Table 9. Output Data Register Formats
Register SUPPLY_OUT XGYRO_OUT1 YGYRO_OUT1 ZGYRO_OUT1 XACCL_OUT YACCL_OUT ZACCL_OUT XMAGN_OUT YMAGN_OUT ZMAGN_OUT TEMP_OUT2 AUX_ADC
1 2
Auxiliary ADC
The AUX_ADC register provides access to the auxiliary ADC input channel. The ADC is a 12-bit successive approximation converter that has an equivalent input circuit to the one shown in Figure 14. The maximum input is 3.3 V. The ESD protection diodes can handle 10 mA without causing irreversible damage. The on resistance (R1) of the switch has a typical value of 100 . The sampling capacitor, C2, has a typical value of 16 pF.
VCC D C1 D R1 C2
Figure 14. Equivalent Analog Input Circuit (Conversion Phase: Switch Open, Track Phase: Switch Closed)
CALIBRATION
Manual Bias Calibration
The bias offset registers in Table 10, Table 11, and Table 12 (hard-iron correction for magnetometer) provide a manual adjustment function for the output of each sensor. For example, if XGYRO_OFF equals 0x1FF6, the XGYRO_OUT offset shifts by -10 LSB, or -0.125/sec. The DIN command for the upper byte is DIN = 0x9B1F; for the lower byte, DIN = 0x9AF6. Table 10. XGYRO_OFF, YGYRO_OFF, ZGYRO_OFF
Bits [15:13] [12:0] Description Default = 0x0000 Not used. Data bits. Twos complement, 0.0125/sec per LSB. Typical adjustment range = 50/sec.
Bits 14 14 14 14 14 14 14 14 14 14 12 12
Format Binary, 5 V = 0x0814 Twos complement Twos complement Twos complement Twos complement Twos complement Twos complement Twos complement Twos complement Twos complement Twos complement Binary, 1 V = 0x04D9
Scale 2.418 mV 0.05/sec 0.05/sec 0.05/sec 3.33 mg 3.33 mg 3.33 mg 0.5 mgauss 0.5 mgauss 0.5 mgauss 0.14C 806 V
Table 11. XACCL_OFF, YACCL_OFF, ZACCL_OFF
Bits [15:12] [11:0] Description Default = 0x0000 Not used. Data bits. Twos complement, 3.3 mg/LSB. Typical adjustment range = 6.75 g.
Assumes that the scaling is set to 300/sec. This factor scales with the range. The typical output for this register at 25C is 0x0000.
Each output data register uses the bit assignments shown in Figure 13. The ND flag indicates that unread data resides in the output data registers. This flag clears and returns to 0 during an output register read sequence. It returns to 1 after the next internal sample updates the registers with new data. The EA flag indicates that one of the error flags in the DIAG_STAT register (see Table 23) is active (true). The remaining 14 bits are for data.
MSB FOR 14-BIT OUTPUT
07907-013
Table 12. XMAGN_HIF, YMAGN_HIF, ZMAGN_HIF
Bits [15:14] [13:0] Description Default = 0x0000 Not used. Data bits. Twos complement, 0.5 mgauss/LSB. Typical adjustment range = 4 gauss.
ND EA MSB FOR 12-BIT OUTPUT
Figure 13. Output Register Bit Assignments
Rev. B | Page 12 of 20
ADIS16400/ADIS16405
Magnetometer Soft-Iron Correction (Scale Factor)
The soft-iron correction factor for the magnetometer provides the opportunity to change the scale factor for each individual axis. Table 13. XMAGN_SIF, YMAGN_SIF, ZMAGN_SIF
Bits [15:12] [11:0] Description Default = 0x0800 Not used. Data bits. Binary, linear scale adjustment factor between 0x0000 (0x) and 0x3FFF (2x).
Table 14. GLOB_CMD
Bits [15:8] [7] [6:5] [4] [3] [2] [1] [0] Description Not used Software reset command Not used Precision autonull command Flash update command Auxiliary DAC data latch Factory calibration restore command Autonull command
Gyroscope Automatic Bias Null Calibration
Set GLOB_CMD[0] = 1 (DIN = 0xBE01) to execute this function, which measures the gyroscope outputs and then loads the gyroscope offset registers with the opposite values to provide a quick bias calibration. Then, all sensor data resets to 0, and the flash memory updates automatically within 50 ms (see Table 14).
Internal Sample Rate
The SMPL_PRD register provides discrete sample rate settings, using the bit assignments in Table 15 and the following equation: tS = tB x (NS + 1), When SMPL_PRD[7:0] = 0x0A, the sample rate = 149 SPS. Table 15. SMPL_PRD
Bits [15:8] [7] [6:0] Description Default = 0x0001 Not used Time base (tB) 0 = 0.61035 ms, 1 = 18.921 ms Increment setting (NS) Internal sample period = tS = tB x (NS + 1)
Gyroscope Precision Automatic Bias Null Calibration
Set GLOB_CMD[4] = 1 (DIN = 0xBE10) to execute this function, which takes the sensor offline for 30 sec while it collects a set of gyroscope data and calculates a more accurate bias correction factor for each gyroscope. Once calculated, the correction factor loads into the three gyroscope offset registers, all sensor data resets to 0, and the flash memory updates automatically within 50 ms (see Table 14).
Restoring Factory Calibration
Set GLOB_CMD[1] = 1 (DIN = 0xBE02) to execute this function, which resets each user calibration register (see Table 10, Table 11, and Figure 12) to 0x0000, resets all sensor data to 0, and automatically updates the flash memory within 50 ms (see Table 14).
Linear Acceleration Bias Compensation (Gyroscope)
Set MSC_CTRL[7] = 1 (DIN = 0xB486) to enable correction for low frequency acceleration influences on gyroscope bias. Note that the DIN sequence also preserves the factory default condition for the data ready function (see Table 19).
The default sample rate setting of 819.2 SPS preserves the sensor bandwidth and provides optimal performance. For systems that value slower sample rates, simply read the device at a slower rate and keep the internal sample rate at 819.2 SPS. Use the programmable filter (SENS_AVG) to reduce the bandwidth along with the reduced read rates. The data-ready function (MSC_CTRL) can drive an interrupt routine that uses a counter to help assure data coherence at the reduced update rates.
Power Management
Setting SMPL_PRD 0x0A also sets the sensor in low power mode. For systems that require the lower power dissipation, insystem characterization helps users to quantify the associated performance trade-offs. In addition to sensor performance, this mode affects SPI data rates (see Table 2). Set SLP_CNT[8] = 1 (DIN = 0xBB01) to start the indefinite sleep mode, which requires a CS assertion (high to low), reset, or power cycle to wake up. Use SLP_CNT[7:0] to put the device in sleep mode for a given period of time. For example, SLP_CNT[7:0] = 0x64 (DIN = 0xBA64) puts the device to sleep for 50 seconds. Table 16. SLP_CNT
Bits [15:9] [8] [7:0] Description Not used Indefinite sleep mode, set to 1 Programmable sleep time bits, 0.5 sec/LSB
OPERATIONAL CONTROL
Global Commands
The GLOB_CMD register provides trigger bits for several useful functions. Setting the assigned bit to 1 starts each operation, which returns to the bit to 0 after completion. For example, set GLOB_CMD[7] = 1 (DIN = 0xBE80) to execute a software reset, which stops the sensor operation and runs the device through its start-up sequence. This includes loading the control registers with their respective flash memory locations prior to producing new data. Reading the GLOB_CMD registers (DIN = 0x3E00) starts the burst mode read sequence.
Rev. B | Page 13 of 20
ADIS16400/ADIS16405
Digital Filtering
A programmable low-pass filter provides additional opportunity for noise reduction on the inertial sensor outputs. This filter contains two cascaded averaging filters that provide a Bartlett window, FIR filter response (see Figure 15). For example, SENS_AVG[2:0] = 100 (DIN = B804) sets each stage tap to 16. When used with the default sample rate of 819.2 SPS, this reduces the sensor bandwidth to approximately 16 Hz.
0 -20 -40
Table 18. GPIO_CTRL
Bits [15:12] [11] [10] [9] [8] [7:4] [3] [2] [1] [0] Description Default = 0x0000 Not used General-Purpose I/O Line 4 (DIO4) data level General-Purpose I/O Line 3 (DIO3) data level General-Purpose I/O Line 2 (DIO2) data level General-Purpose I/O Line 1 (DIO1) data level Not used General-Purpose I/O Line 4 (DIO4), direction control 1 = output, 0 = input General-Purpose I/O Line 3 (DIO3), direction control 1 = output, 0 = input General-Purpose I/O Line 2 (DIO2), direction control 1 = output, 0 = input General-Purpose I/O Line 1 (DIO1), direction control 1 = output, 0 = input
MAGNITUDE (dB)
-60 -80 -100 -120 -140 0.001 N=2 N=4 N = 16 N = 64
07906-015
Input Clock Configuration
The input clock allows for external control over sampling in the ADIS16400/ADIS16405. Set GPIO_CTRL[3] = 0 (DIN = 0x0B200) and SMPL_PRD[7:0] = 0x00 (DIN = 0xB600) to enable this function. See Table 2 and Figure 4 for timing information.
0.01
0.1
1
FREQUENCY (f/fS)
Figure 15. Bartlett Window FIR Frequency Response (Taps = 2N + 1, Phase = N Samples)
Data Ready I/O Indicator
The factory default sets DIO1 as a positive data ready indicator signal. The MSC_CTRL[2:0] register provides configuration options for changing this. For example, set MSC_CTRL[2:0] = 100 (DIN = 0xB404) to change the polarity of the data ready signal for interrupt inputs that require negative logic inputs for activation. The resulting pulse width is be between 100 s and 200 s over all conditions. Table 19. MSC_CTRL
Bits [15:12] [11] [10] [9] [8] [7] [6] [5:3] [2] [1] [0] Description Default = 0x0006 Not used Memory test (clears on completion) 1 = enabled, 0 = disabled Internal self-test enable (clears on completion) 1 = enabled, 0 = disabled Manual self-test, negative stimulus 1 = enabled, 0 = disabled Manual self-test, positive stimulus 1 = enabled, 0 = disabled Linear acceleration bias compensation for gyroscopes 1 = enabled, 0 = disabled Linear accelerometer origin alignment 1 = enabled, 0 = disabled Not used Data ready enable 1 = enabled, 0 = disabled Data ready polarity 1 = active high, 0 = active low Data ready line select 1 = DIO2, 0 = DIO1
Dynamic Range
There are three dynamic range settings for the gyroscope. The lower dynamic range settings (75/sec and 150/sec) limit the minimum filter tap sizes to maintain resolution. For example, set SENS_AVG[10:8] = 010 (DIN = 0xB902) for a measurement range of 150/sec. Because this setting can influence the filter settings, program SENS_AVG[10:8], then SENS_AVG[2:0] if more filtering is required. Table 17. SENS_AVG
Bits [15:11] [10:8] Settings Description Default = 0x0402 Not used Measurement range (sensitivity) selection 300/sec (default condition) 150/sec, filter taps 4 (Bits[2:0] 0x02) 75/sec, filter taps 16 (Bits[2:0] 0x04) Not used Number of taps in each stage N = 2M
100 010 001 [7:3] [2:0]
INPUT/OUTPUT FUNCTIONS
General-Purpose I/O
DIO1, DIO2, DIO3, and DIO4 are configurable, generalpurpose I/O lines that serve multiple purposes according to the following control register priority: MSC_CTRL, ALM_CTRL, and GPIO_CTRL. For example, set GPIO_CTRL = 0x080C (DIN = 0xB308, and then 0xB20C) to set DIO1 and DIO2 as inputs and DIO3 and DIO4 as outputs, with DIO3 set low and DIO4 set high.
Rev. B | Page 14 of 20
ADIS16400/ADIS16405
Auxiliary DAC
The 12-bit AUX_DAC line can drive its output to within 5 mV of the ground reference when it is not sinking current. As the output approaches 0 V, the linearity begins to degrade (~100 LSB beginning point). As the sink current increases, the nonlinear range increases. The DAC latch command moves the values of the AUX_DAC register into the DAC input register, enabling both bytes to take effect at the same time. Table 20. AUX_DAC
Bits [15:12] [11:0] Description Default = 0x0000 Not used. Data bits. Scale factor = 0.8059 mV/code, offset binary format, 0 V = 0 codes.
Status
The error flags provide indicator functions for common systemlevel issues. All of the flags clear (set to 0) after each DIAG_STAT register read cycle. If an error condition remains, the error flag returns to 1 during the next sample cycle. DIAG_STAT[1:0] does not require a read of this register to return to 0. Table 22. Manual Self-Test Example Sequence
DIN 0xB601 0xB904 0xB802 0x0400 0xB502 0x0400 Description SMPL_PRD[7:0] = 0x01, sample rate = 819.2 SPS. SENS_AVG[15:8] = 0x04, gyroscope range = 300/sec. SENS_AVG[7:0] = 0x02, four-tap averaging filter. Delay = 50 ms. Read XGYRO_OUT. MSC_CTRL[9] = 1, gyroscope negative self-test. Delay = 50 ms. Read XGYRO_OUT. Calculate the positive change from the first reading to the second reading of XGYRO_OUT, and check to make sure the change is within the positive self-test response range specified in Table 1. MSC_CTRL[9:8] = 01, gyroscope/accelerometer positive self-test. Delay = 50 ms. Read XGYRO_OUT. Calculate the negative change from the first reading to the third reading of XGYRO_OUT, and check to make sure the change is within the positive self-test response range specified in Table 1. MSC_CTRL[15:8] = 0x00.
Table 21. Setting AUX_DAC = 1 V
DIN 0xB0D9 0xB104 0xBE04 Description AUX_DAC[7:0] = 0xD9 (217 LSB). AUX_DAC[15:8] = 0x04 (1024 LSB). GLOB_CMD[2] = 1. Move values into the DAC input register, resulting in a 1 V output level.
0xB501
DIAGNOSTICS
Self-Test
The self-test function offers the opportunity to verify the mechanical integrity of each MEMS sensor. It applies an electrostatic force to each sensor element, which results in mechanical displacement that simulates a response to actual motion. Table 1 lists the expected response for each sensor, which provides pass/fail criteria. Set MSC_CTRL[10] = 1 (DIN = 0xB504) to run the internal self-test routine, which exercises all inertial sensors, measures each response, makes pass/fail decisions, and reports them to error flags in the DIAG_STAT register. MSC_CTRL[10] resets itself to 0 after completing the routine. MSC_CTRL[9:8] (DIN = 0xB502 or 0xB501) provide manual control over the self-test function. Table 22 shows an example test flow for using this option to check the x-axis gyroscope. Zero motion provides results that are more reliable. The settings in Table 22 are flexible and provide opportunity for optimization around speed and noise influence. For example, using fewer filtering taps decreases delay times but increases the opportunity for noise influence.
0x0400
0xB500
Table 23. DIAG_STAT Bit Descriptions
Bit [15] [14] [13] [12] [11] [10] [9] [8] [7] [6] [5] [4] [3] [2] [1] [0] Description Z-axis accelerometer self-test failure (1 = fail, 0 = pass) Y-axis accelerometer self-test failure (1 = fail, 0 = pass) X-axis accelerometer self-test failure (1 = fail, 0 = pass) Z-axis gyroscope self-test failure (1 = fail, 0 = pass) Y-axis gyroscope self-test failure (1 = fail, 0 = pass) X-axis gyroscope self-test failure (1 = fail, 0 = pass) Alarm 2 status (1 = active, 0 = inactive) Alarm 1 status (1 = active, 0 = inactive) Not used Flash test, checksum flag (1 = fail, 0 = pass) Self-test diagnostic error flag (1 = fail, 0 = pass) Sensor overrange (1 = fail, 0 = pass) SPI communication failure (1 = fail, 0 = pass) Flash update failure (1 = fail, 0 = pass) Power supply above 5.25 V (1 = power supply 5.25 V, 0 = power supply 5.25 V) Power supply below 4.75 V (1 = power supply 4.75 V, 0 = power supply 4.75 V)
Memory Test
Setting MSC_CTRL[11] = 1 (DIN = 0xB508) performs a checksum verification of the flash memory locations. The pass/fail result loads into the DIAG_STAT[6] register.
Rev. B | Page 15 of 20
ADIS16400/ADIS16405
Alarm Registers
The alarm function provides monitoring for two independent conditions. The ALM_CTRL register provides control inputs for data source, data filtering (prior to comparison), static comparison, dynamic rate-of-change comparison, and output indicator configurations. The ALM_MAGx registers establish the trigger threshold and polarity configurations. Table 27 gives an example of how to configure a static alarm. The ALM_SMPLx registers provide the number of samples to use in the dynamic rate-of-change configuration. The period equals the number in the ALM_SMPLx register multiplied by the sample period time, which is established by the SMPL_PRD register. See Table 28 for an example of how to configure the sensor for this type of function. Table 24. ALM_CTRL Bit Designations
Bits [15:12] Settings 0000 0001 0010 0011 0100 0101 0110 0111 1000 1001 1010 1011 1100 [11:8] [7] [6] [5] [4] [3] [2] [1] [0] Description Default = 0x0000 Alarm 2 source selection Disable Power supply output X-axis gyroscope output Y-axis gyroscope output Z-axis gyroscope output X-axis accelerometer output Y-axis accelerometer output Z-axis accelerometer output X-axis magnetometer output Y-axis magnetometer output Z-axis magnetometer output Gyroscope temperature output Auxiliary ADC input Alarm 1 source selection (same as Alarm 2) Rate-of-change (ROC) enable for Alarm 2 1 = rate of change, 0 = static level Rate-of-change (ROC) enable for Alarm 1 1 = rate of change, 0 = static level Not used Comparison data filter setting 1 = filtered data, 0 = unfiltered data Not used Alarm output enable 1 = enabled, 0 = disabled Alarm output polarity 1 = active high, 0 = active low Alarm output line select 1 = DIO2, 0 = DIO1
Table 25. ALM_MAG1, ALM_MAG2
Bits [15] [14] [13:0] Description Default = 0x0000 Comparison polarity 1 = greater than, 0 = less than Not used Data bits that match the format of the trigger source selection
Table 26. ALM_SMPL1, ALM_SMPL2
Bits [15:8] [7:0] Description Default = 0x0000 Not used Data bits: number of samples (both 0x00 and 0x01 = 1)
Table 27. Alarm Configuration Example 1
DIN 0xAF55, 0xAE17 Description ALM_CTRL = 0x5517. Alarm 1 input = XACCL_OUT. Alarm 2 input = XACCL_OUT. Static level comparison, filtered data. DIO2 output indicator, positive polarity. ALM_MAG1 = 0x8341. Alarm 1 is true if XACCL_OUT > +0.5 g. ALM_MAG2= 0x3CBF. Alarm 2 is true if XACCL_OUT < -0.5 g.
0xA783, 0xA641 0xA93C, 0xA8BF
Table 28. Alarm Configuration Example 2
DIN 0xAF76, 0xAE87 Description ALM_CTRL = 0x7687. Alarm 1 input = ZACCL_OUT. Alarm 2 input = YACCL_OUT. Rate of change comparison, unfiltered data. DIO2 output indicator, positive polarity. SMPL_PRD = 0x0001. Sample rate = 819.2 SPS. ALM_SMPL1 = 0x0008. Alarm 1 rate of change period = 9.77 ms. ALM_SMPL2= 0x0050. Alarm 2 rate of change period = 97.7 ms. ALM_MAG1 = 0x8341. Alarm 1 is true if XACCL_OUT > +0.5 g. ALM_MAG2= 0x3CBE. Alarm 2 is true if XACCL_OUT < -0.5 g.
0xB601 0xAB08 0xAC50 0xA783, 0xA641 0xA93C, 0xA8BE
Rev. B | Page 16 of 20
ADIS16400/ADIS16405 OUTLINE DIMENSIONS
31.900 31.700 31.500 23.454 23.200 22.946 2.382 BSC 9.464 9.210 8.956 (2x) 17.41 17.21 17.01 (2x) 4.20 4.00 3.80 (2x)
BOTTOM VIEW 21.410 21.210 21.010
1.588 BSC TOP VIEW 1.588 BSC 22.964 22.710 22.456
10.60 BSC
PIN 24
14.950 14.550 14.150 10.50 BSC FRONT VIEW
5.20 5.00 4.80 (2x)
1.00 BSC
7.18 BSC
CASTING FEATURE
PIN 1
0.05 BSC
12.10 BSC
2.00 BSC
23.504 23.250 22.996 2.660 2.500 2.340 SIDE VIEW DETAIL A 4.330 BSC DETAIL A 4.162 BSC
0.305 BSC (24x)
1.00 BSC (22x) 14.00 BSC
1.65 BSC
122208-C
Figure 16. 24-Lead Module with Connector Interface (ML-24-2) Dimensions shown in millimeters
ORDERING GUIDE
Model ADIS16400BMLZ 1 ADIS16400/PCBZ1, 2 ADIS16405BMLZ1 ADIS16405/PCBZ1, 3
1 2
Temperature Range -40C to +105C -40C to +105C
Package Description 24-Lead Module with Connector Interface Interface Board 24-Lead Module with Connector Interface Interface Board
Package Option ML-24-2 ML-24-2
Z = RoHS Compliant Part. This includes one ADIS16400BMLZ and an interface PCB. 3 This includes one ADIS16405BMLZ and an interface PCB.
Rev. B | Page 17 of 20
ADIS16400/ADIS16405 NOTES
Rev. B | Page 18 of 20
ADIS16400/ADIS16405 NOTES
Rev. B | Page 19 of 20
ADIS16400/ADIS16405 NOTES
(c)2009 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D07907-0-7/09(B)
Rev. B | Page 20 of 20

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